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Engineering Technology
Description: Advanced metrology techniques such as scanning electron microscopy/transmission electron microscopy (SEM/TEM), energy dispersive spectroscopy (EDS), scanning probe techniques (AFM/STM, EFM, MFM, etc.) will be examined. Letter grade only.
Units: 3
No sections currently offered.
Prerequisite: ET 412, ET 416
Engineering Technology
Term : Winter 2025
Catalog Year : 2025-2026
ET 417 - Advanced Metrology Techniques
Description: Advanced metrology techniques such as scanning electron microscopy/transmission electron microscopy (SEM/TEM), energy dispersive spectroscopy (EDS), scanning probe techniques (AFM/STM, EFM, MFM, etc.) will be examined. Letter grade only.
Units: 3
No sections currently offered.
Prerequisite: ET 412, ET 416