Return to search

Engineering Technology
Term : Winter 2025
Catalog Year : 2025-2026

ET 418 - Statistical Process Control


Description: Foundational knowledge and practical skills to apply statistical process control (SPC) techniques for optimizing processes and ensuring quality in microelectronics manufacturing with a specific interest in metrology. Letter grade only.

Units: 3

No sections currently offered.

Prerequisite: ET 202, ET 315